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    1996 Sep 11 5 NXP Semiconductors Product data sheet High-speed diode 1PS193 Fig.6 Reverse recovery voltage test circuit and waveforms. (1) IR = 1 mA. handbook, full pagewidth t rr (1) IF t output signal tr t tp 10% 90% VR input signal V = V I x RRF S R = 50S Ω IF D.U.T. R = 50i Ω SAMPLING OSCILLOSCOPE MGA881 Fig.7 Forward recovery voltage test circuit and waveforms. tr t tp 10% 90% I input signal R = 50S Ω I R = 50i Ω OSCILLOSCOPE 1 kΩ 450 Ω D.U.T. MGA882 Vfr t output signal V |